{"id":26,"date":"2016-10-21T11:04:35","date_gmt":"2016-10-21T09:04:35","guid":{"rendered":"https:\/\/projects.lne.eu\/jrp-hydrogen\/?page_id=26"},"modified":"2020-10-19T11:14:05","modified_gmt":"2020-10-19T09:14:05","slug":"tools-publications","status":"publish","type":"page","link":"https:\/\/projects.lne.eu\/jrp-advent\/tools-publications\/","title":{"rendered":"Tools \/ publications"},"content":{"rendered":"

REPORT DOCUMENTS<\/strong><\/h3>\n

[1] 1st Publishable Summary<\/a>.<\/p>\n

[2]\u00a02nd Publishable Summary<\/a><\/p>\n

[3] 3rd Publishable Summary<\/a><\/p>\n

[4] 4th Publishable Summary<\/a><\/p>\n

Good Practice Guide<\/strong><\/h3>\n

[1] Good practice guide for calibrated capacitance measurements using scanning microwave microscopy<\/a>.<\/p>\n

STANDARDS & REGULATORY <\/strong><\/h3>\n

[1] – M. Cain, “Presentation of Consortium activities\/ research results<\/strong>“, IEEE UFFC – Ultrasonics, Ferroelectrics and Frequency Control Society ,\u00a0 USA, May 2018.<\/p>\n

[2] – M. Cain, “Presentation of Consortium activities\/ research results<\/strong>“, IEEE UFFC – Technical Working Areas (TWA) 24 Performance Related Properties of Electroceramics ,\u00a0 USA, May 2019.<\/p>\n

[3] – M. Cain, “General participation in the committee<\/strong>“, ISO TC 206 Fine Ceramics ,\u00a0 USA, June 2019.<\/p>\n

[4] – M. Cain, “Presentation of consortium activities\/ research results<\/strong>“, (UFFC) Ultrasonics, Ferroelectrics and Frequency Control Society ,\u00a0 USA, May 2019.<\/p>\n

PEER – REVIEWED PUBLICATIONS<\/strong><\/h3>\n

[1] – B. K\u00e4stner, F. Schm\u00e4hling, A. Hornemann, G. U., A. Hoehl, M.s Kruskopf, K.s Pierz, M. B. Raschke, G. W\u00fcbbeler, and C. Elster, \u201cCompressed sensing FTIR nano-spectroscopy and nano-imaging<\/strong>\u201d, Optic Express, April 2018, https:\/\/doi.org\/10.1364\/OE.26.018115<\/a>.<\/p>\n

[2] – B. K\u00e4stner, C. M. Johnson, P. Hermann, M. Kruskopf, K. Pierz, A. Hoehl, A. Hornemann, G. Ulrich, J. Fehmel, P. Patoka, E. Ru\u0308hl, and G. Ulm, \u201cInfrared Nanospectroscopy of Phospholipid and Surfactin Monolayer\u201d, ACS Omega, April 2018, https:\/\/pubs.acs.org\/doi\/10.1021\/acsomega.7b01931<\/a><\/p>\n

[3] – T. Le Quang, D. Vasyukov, J. Hoffmann, A. Buchter, M. Zeier, \u201cFabrication and Measurements of Inductive Devices for Scanning Microwave Microscopy\u201d, IEEE-Nano, July 2019, DOI: 10.1109\/NANO46743.2019.8993943<\/u><\/p>\n

[4] – I. D. Barcelos, H. A. Bechtel, C. J. S. de Matos, D. A. Bahamon, B. Kaestner, F. C. B. Maia and R. O. Freitas, \u201cProbing Polaritons in 2D Materials with Synchrotron\u201d, December 2019, https:\/\/doi.org\/10.1002\/adom.201901091<\/a><\/p>\n

[5] – D. Kendig, H. Votsi, J Urbonas, C. Matei, P. H. Aaen \u201cDynamic Temperature Measurements of a GaN DC\/DC Boost Converter at MHz Frequencies\u201d, IEEE Transactions on Power Electronics, January 2020, DOI: <\/u>10.1109\/TPEL.2020.2964996<\/a>, OA link: http:\/\/epubs.surrey.ac.uk\/853825\/<\/u><\/p>\n

[6] – M. Staruch, H. ElBidweihy, M. G. Cain, P. Thompson, C. A. Lucas, and P. Finkel, \u201cMagnetic and multiferroic properties of dilute Fe-doped BaTiO3 crystals\u201d, March 2020, http:\/\/dx.doi.org\/10.1063\/5.0002863<\/a><\/p>\n

[7] – J. A Moran-Meza, A. Delvall\u00e9e, D. Allal, F. Piquemal, “A substitution method for nanoscale capacitance calibration using scanning microwave microscopy”, April 2020, https:\/\/doi.org\/10.1088\/1361-6501\/ab82c1<\/a><\/p>\n

[8] – M. Wansleben, J. Vinson, A. W\u00e4hlisch, K. Bzheumikhova, P. H\u00f6nicke, B. Beckhoff, and Y. Kayser, \u201cSpeciation of FeS and FeS2 by means of X-ray Emission Spectroscopy using a compact full-cylinder von Hamos spectrometer\u201d, May 2020 , https:\/\/arxiv.org\/abs\/2005.09509<\/a><\/p>\n

[9] – M. A. Azp\u00farua, M. Pous, F. Silva, “ncertainty Analysis in the Measurement of Switching Losses in GaN FETs Power Converters”, 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 220, 10.1109\/I2MTC43012.2020.9129552.<\/p>\n

[10] – E. A. Patterson, M. Staruch, B. R. Matis, S. Young, S. E. Lofland, L. Antonelli, F. Blackmon, D. Damjanovic, M. G. Cain, P. B. J. Thompson, C. A. Lucas, and P. Fink, , \u201cDynamic piezoelectric response of relaxor single crystal under electrically driven inter-ferroelectric phase transformations\u201d, June 2020, https:\/\/aip.scitation.org\/doi\/pdf\/10.1063\/5.0007820<\/a><\/p>\n

[11] – M. Cain, M. Staruch, P. Thompson, C. Lucas, D. Wermeille, Y. Kayser, B. Beckhoff, S.Loafland, P. Finkel, \u201cIn situ electric-field study of surface effects in domain engineered Pb(In1\/2Nb1\/2)O3-Pb(Mg1\/3Nb2\/3)O3-PbTiO3 relaxor crystals by grazing incidence diffraction\u201d, September 2020, doi:10.3390\/cryst10090728<\/p>\n

CONFERENCES<\/strong><\/h3>\n

[1] – J. Carlos, A. Goncalves, I. ALAJI, D. Gloria, V. Gidel, F. Gianesello, S. Lepilliet, G. Ducournau, F. Danneville, C. Gaqui\u00e8re, \u201cOn wafer millimetre wave power detection using a PN junction diode in BiCMOS 55 nm for in-situ large signal characterization<\/strong>\u201d, EuMW 2018, September 2018.<\/p>\n

[2] – M. Hytch, \u201cInvestigating the potential of SiGe Diode in BiCMOS 55nm for power detection and datacom applications at 300 GHz<\/strong>\u201d, IRMMW -2018, September 2018<\/p>\n

[3] – M. Hytch \u201cIn operando electron holography study of working nanocapacitors<\/strong>\u201d, International Microscopy Congress (IMC16), September 2018.<\/p>\n

[4] – J. Hoffmann, \u201cCOMSOL\u00ae Simulation for Scanning Microwave Microscopic Experiments<\/strong>\u201d, Comsol conference\u201d, October 2018.<\/p>\n

[5] – M. Cain, P. Finkel, M. Staruch, P. Thompson, D. Wermeille, \u201cIn situ study of inter-ferroelectric phase transitions in domain engineered ferroic crystals<\/strong>\u201d, MRS Fall 2018, November 2018.<\/p>\n

[6] – P. Klapetek \u201cFast mechanical model for probe-sample heat transfer calculations in Scanning Thermal Microscopy<\/strong>\u201d, NHMT-VI, December 2018.<\/p>\n

[7] – J. A Moran-Meza, A. Delvall\u00e9e, D. Allal, F. Piquemal, \u201cCapacitance measurements at nanoscale with scanning microwave microscopy (SMM)<\/strong>\u201d, C\u2019Nano2018: The Nanoscience meeting, December 2018.<\/p>\n

[8] – J. onas Urbonas, Cristian Matei, Peter Aaen, \u201cTransient and Steady-State Thermal Measurements of GaN-on-SiC HEMT Transistors Under Realistic Microwave Drive Conditions<\/strong>\u201d, 92nd ARFTG Microwave Measurement Conference, January 2019.<\/p>\n

[9] – J. A Moran-Meza, A. Delvall\u00e9e, D. Allal, F. Piquemal, \u201cMesures de capacit\u00e9s par microscopie Micro-onde \u00e0 champ proche (SMM)<\/strong>\u201d, 22\u00e8me Forum des Microscopies \u00e0 Sondes Locales, March 2019.<\/p>\n

[10] – M. Hytch, \u201cMeasuring electric fields in operando devices by electron holography<\/strong>\u201d, MSM XXI, April 2019.<\/p>\n

[11] – M. Cain, \u201cIn situ study of inter-ferroelectric phase transitions in domain engineered ferroic crystals<\/strong>\u201d, 2019 \u00a0\u00a0Workshop On Accoustic Transduction Materials and Devices, May 2019.<\/p>\n

[12] I. Alaji, \u201cD\u00e9tection de puissance sur wafer \u00e0 l’aide de diode PN pour les applications TH<\/strong>\u201d, National Journ\u00e9es National Microondes, May 2019.<\/p>\n

[13] – J. M. Moran, A. Delvall\u00e9e, D. Allal, F. Piquemal \u201cCapacitance mapping at nanoscale by scanning microwave microscopy (SMM): Metrological aspects<\/strong>\u201d, European Materials Research Society – Spring Meeting 2019, May 2019.<\/p>\n

[14] – T. Le Quang, D. Vasyukov, J. Hoffmann, A. Buchter, M. Zeier \u201cImpedance Standards for Scanning Microwave Microscopy<\/strong>\u201d, Nano Metrology 2019, June 2019.<\/p>\n

[15] – M. Hytch, \u201cIn-situ electron holography with the I2TEM (HF3300-C) microscope<\/strong>\u201d, Inauguration of Hitachi HF5000 at Fraunhofer Halle, June 2019.<\/p>\n

[16] – T. Le Quang, D. Vasyukov, J. Hoffmann, A. Buchter, M. Zeier, \u201cFabrication and Measurements of Inductive Devices for Scanning Microwave Microscopy<\/strong>\u201d, IEEE Nano 2019, July 2019.<\/p>\n

[17] – M. Cain , M. Staruch, P. Finkel, P. Thompson, D. Wermeille, \u201cIn situ study of inter- ferroelectric phase transitions in domain engineered ferroic crystals<\/strong>\u201d, Joint 2019 f2c????2 Conference, July 2019.<\/p>\n

[18] – M. Staruch,\u00a0H. H. A. ElBidweihy, M. Cain, P. Thompson, P. Finkel, \u201cMagnetic and Multiferroic Behavior in Fe Doped BaTiO3 Single Crystals<\/strong>\u201d, Joint 2019 f2c????2 Conference, July 2019.<\/p>\n

[19] – H. Votsi, J. Urbonas, P. H. Aaen \u201cExperimental Verification and Imaging of Radiation Due to Coaxial-to-Microstrip Transitions<\/strong>\u201d, 93rd ARFTG Microwave Measurement Conference\u201d, July 2019.<\/p>\n

[20] – \u201cComputational scattering-type near-field optical microscopy<\/strong>\u201d, 10th International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources,\u00a0\u00a0\u00a0\u00a0\u00a0 September 2019.<\/p>\n

[21] – J. M. Moran, A. Delvall\u00e9e, D. Allal, F. Piquemal ,\u201cA substitution method for capacitance calibration using scanning microwave microscopy<\/strong>\u201d, NanoScale2019, 12th Seminar on Quantitative Microscopy (QM) & 8th Seminar on nanoscale Calibration Standards and Methods, October 2019.<\/p>\n

[22] – Y. Kaiser, \u201cTowards operando EXAFS investigations of advanced piezoelectric materials<\/strong>\u201d, PRORA November 2019.<\/p>\n

[23] – Y. Kaiser, \u201cTowards operando EXAFS investigations of advanced piezoelectric materials National BESSY User Meeting<\/strong>\u201d,\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 December 2019.<\/p>\n

[24] – M. Cain, \u201cLIMM Analysis of Novel Lead-Free Pyroelectric Materials for IR Array Detectors<\/strong>\u201d, ISAF 2020, July 2020.<\/p>\n

[25] – I. Kolevatov, B. Karlsen, K. B. Ellingsberg, T. S\u00f8rsdal, H. Malmbekk \u201cIn-circuit current Measurements with a frequency above 1 MHz: a shunt based on active Components<\/strong>\u201d, CPEM 2020, August 2020.<\/p>\n

[26] – “Photocurrent nanoscopy of domain switching in collinear antiferromagnet CuMnAs<\/strong>“, NFO 16, August 2020.<\/p>\n

WORKSHOPS – SEMINARS:<\/strong><\/h3>\n

[1] – CNRS, “In-situ biasing for electron holography experiments of nanodevices”, <\/strong>Holography Workshop<\/i>,\u00a0 Germany, June 2018.<\/p>\n

[2] – Xiaobang Shang, Nick Ridler, Peter Aaen, “Multi-physics characterisation of RF components for advanced energy-saving technology in 5G and IoT<\/strong>“, Keysight Industrial Seminar on Next-generation Electronics Applications for 5G Communications<\/em> , University of SURREY, United Kingdom, July 2018.<\/p>\n

[3] – Jonas Urbonas, Critian Matei, Peter Aaen , “Advances in Electrothermal and Electro-optic Characterization of Microwave Power Amplifiers<\/strong>“, Keysight Industrial Seminar on Next-generation Electronics Applications for 5G Communications<\/em> , University of SURREY, United Kingdom, July 2018.<\/p>\n

[4] – Fran\u00e7ois Ziad\u00e9, “ADVENT Project Overview<\/strong>“,\u00a0AREMIF (Microwave Network Ile de France) meeting, Paris, France, June 2018.<\/p>\n

[5] – Fran\u00e7ois Ziad\u00e9, “European Project in Metrology to support energy saving technology: overview and focus on microwave power measurements<\/strong>\u201d, X-ray and neutron scattering and spectroscopies in ferroelectric and multiferroic research workshop V, London, United Kingdom, February 2019.<\/p>\n

[6] – Martin Hytch, “Challenges of in-situ characterisation of ferroelectric thin films by transmission electron microscopy<\/strong>\u201d, X-ray and neutron scattering and spectroscopies in ferroelectric and multiferroic research workshop V, London, United Kingdom, February 2019.<\/p>\n

[7]\u00a0 – Yves Kaiser, “Towards operando EXAFS investigations of advanced piezoelectric materials<\/strong>\u201d, X-ray and neutron scattering and spectroscopies in ferroelectric and multiferroic research workshop V, London, United Kingdom, February 2019.<\/p>\n

[8] – Markys Cain, “In situ synchrotron X-ray diffraction stress-induced phase transitions in ferroelectric materials – new capability at the XMaS beamline at the ESRF<\/strong>\u201d, X-ray and neutron scattering and spectroscopies in ferroelectric and multiferroic research workshop V, London, United Kingdom, February 2019.<\/p>\n

[9] – Bernd K\u00e4stner, Franko Schm\u00e4hling, Andrea Hornemann, Georg Ulrich, Arne Hoehl, Mattias Kruskopf, Klaus Pierz, Gerd W\u00fcbbeler, and Clemens Elster, <\/sup>Samuel Johnson, and Markus B. Raschke\u00a0, “Computational scattering-type near-field optical microscopy<\/strong>\u201d, 10th International Workshop on Infrared Microscopy and\u00a0 spectroscopy with Accelerator Based Sources, Campinas, Brazil, September 2019.<\/p>\n

[10] – F.Ziad\u00e9, “Key energy figures in ICT sector and main aspect of the top – down approach adopted in the European Project in Metrology ADVENT<\/strong> “, EuMW 2019, Paris , September 2019.<\/p>\n

[11] -K., R.Judaschke, F.<\/u> Gellersen<\/u>, “Traceable RF power measurements at PTB – an overview<\/strong>\u00a0“, EuMW 2019, Paris , September 2019.<\/p>\n

[12] – I. Alaji, D. Gloria, G. Ducournau, C. Gaqui\u00e8re, “Power detection based on Silicon Schottky diode for 5G applications<\/strong>\u00a0“, EuMW 2019, Paris , September 2019.<\/p>\n

[13] – D. Allal, F. Ziad\u00e9, “Calibration of on chip microwave power sensors\u00a0<\/strong>“, EuMW 2019, Paris , September 2019.<\/p>\n

[14] –\u00a0B., H. <\/u>Takhedmit<\/u>, E. Richalot, J-M. Laheurte, “Power Loss Estimation in RF Circuits Based on Magnetic Near-Field Measurements\u00a0<\/strong>“, EuMW 2019, Paris , September 2019.<\/p>\n

[15] – D. Stalder, M. Wollensack, J. Hoffmann, M. Zeier, F.Ziad\u00e9, “Power Traceable Noise Temperature Calibration Based on RF-Power<\/strong>“, EuMW 2019, Paris , September 2019.<\/p>\n

[16] – X. Shang, N. Ridler, “Calibration techniques for on-chip S-parameter measurements<\/strong>“, EuMW 2019, Paris , September 2019.<\/p>\n

[17] – M. Salter, “Uncertainties in VNA and NVNA measurements<\/strong>“, EuMW 2019, Paris , September 2019.<\/p>\n

[18] – H. Votsi, P. H.Aaen, “Multiphysics microwave characterisation of GaN power transistors<\/strong>“, EuMW 2019, Paris , September 2019.<\/p>\n

[19] – M. Azpurua, M. Pous, F. Silva, “Challenges and techniques for measuring high-speed switching waveforms in GaN power converters<\/strong>“, EuMW 2019, Paris , September 2019.<\/p>\n

[20] – T. Le Quang<\/u>, D. Vasyukov, J. Hoffmann, A. Buchter, M. Zeier , “Design and Simulation of Impedance Standards for Scanning Microwave Microscopes<\/strong>“, EuMW 2019, Paris , September 2019.<\/p>\n

[21] – J. Moran, F. Piquemal, “Metrology for capacitance measurements using Scanning Microwave Microscope<\/strong>“, EuMW 2019, Paris , September 2019.<\/p>\n

OTHER – DISSEMINATIONS:<\/strong><\/h3>\n

[1] – Newsletter, XMas Newsletter 2017, Feb 2018 2018.<\/p>\n

https:\/\/warwick.ac.uk\/fac\/cross_fac\/xmas\/impact\/newsletters\/<\/a><\/p>\n

[2] – Article published in professional journal, MET Info,\u00a0Vol. 25 No. 1, 2018<\/a>.<\/p>\n

[3] – Article published in professional journal, Synchrotron Radiation News, April 2018.<\/p>\n

[4] – Seminar, Collaboration ADVENT – ACSIEL ALLIANCE ELECTRONIQUE, April 2018.<\/p>\n

[5 ] – Event,\u00a0Presentation for Project Advisory Group members and collaborators teleconference, April 2018.<\/p>\n

[6] – Article published in professional journal, METinfo, May 2018.<\/p>\n

[7] – Seminar, 2018 International Workshop on Acoustic Transduction Materials and Devices, May 2018<\/p>\n

[8] – Seminar, 2018 International Workshop on Acoustic Transduction Materials and Devices, May 2018<\/p>\n

[9] – Article published in professional journal, SI-Traceable Analysis of Nanomaterials by X-ray Spectrometry, Juluy 2018.<\/p>\n

[10] – Newsletter, Club nanoMetrologie Newsletter N\u00b010, September 2018.<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

REPORT DOCUMENTS [1] 1st Publishable Summary. [2]\u00a02nd Publishable Summary [3] 3rd Publishable Summary [4] 4th Publishable Summary Good Practice Guide [1] Good practice guide for calibrated capacitance measurements using scanning microwave microscopy. STANDARDS & REGULATORY [1] – M. Cain, “Presentation of Consortium activities\/ research results“, IEEE UFFC – Ultrasonics, Ferroelectrics and Frequency Control Society ,\u00a0 […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_genesis_hide_title":false,"_genesis_hide_breadcrumbs":false,"_genesis_hide_singular_image":false,"_genesis_hide_footer_widgets":false,"_genesis_custom_body_class":"","_genesis_custom_post_class":"","_genesis_layout":"","footnotes":""},"class_list":{"0":"post-26","1":"page","2":"type-page","3":"status-publish","5":"entry","6":"gs-1","7":"gs-odd","8":"gs-even","9":"gs-featured-content-entry"},"acf":[],"_links":{"self":[{"href":"https:\/\/projects.lne.eu\/jrp-advent\/wp-json\/wp\/v2\/pages\/26"}],"collection":[{"href":"https:\/\/projects.lne.eu\/jrp-advent\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/projects.lne.eu\/jrp-advent\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/projects.lne.eu\/jrp-advent\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/projects.lne.eu\/jrp-advent\/wp-json\/wp\/v2\/comments?post=26"}],"version-history":[{"count":66,"href":"https:\/\/projects.lne.eu\/jrp-advent\/wp-json\/wp\/v2\/pages\/26\/revisions"}],"predecessor-version":[{"id":1582,"href":"https:\/\/projects.lne.eu\/jrp-advent\/wp-json\/wp\/v2\/pages\/26\/revisions\/1582"}],"wp:attachment":[{"href":"https:\/\/projects.lne.eu\/jrp-advent\/wp-json\/wp\/v2\/media?parent=26"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}