You can check and download our First Publishable Summary<\/strong>.<\/a><\/p>\n You can check and download our Second Publishable Summary<\/a><\/strong><\/p>\n You can check and download our Third Publishable Summary<\/a><\/strong><\/p>\n You can check and download our Four Publishable Summary<\/a><\/strong><\/p>\n You can check and download our Final Publishable Summary<\/strong><\/a><\/p>\n [1] LNE and ISC participation to IEC TC 113 \u201cNanotechnology for electrotechnical products and systems\u201d, ahG 13 “Wafer-scale system integration”, Nov. 2021<\/p>\n [2] ISC participation to IEC TC 113 \u201cNanotechnology for electrotechnical products and systems\u201d, ahG 13 “Wafer-scale system integration”, Apr. 2022<\/p>\n [3] LNE participation to AFNOR X457 “nanotechnology”, Oct 2022<\/p>\n [4] BAM participation to ISO – TC 107 Metallic and other inorganic coatings, June 2022<\/p>\n [5] BAM participation to DIN – NA 062-01-61 AA: Measuring and test methods for coatings and coating systems, Oct 2022<\/p>\n [6] ISC participation to IEC TC 113 \u201cNanotechnology for electrotechnical products and systems\u201d, ahG 13 “Wafer-scale system integration”, Dec. 2022<\/p>\n [1] \u201cExtend IQ Six-Port Demodulator RF Bandwidth by 250% Using Fourier Based Modelling\u201d, IEEE Conference on Antenna Measurements & Applications (CAMA), 2021, France<\/p>\n [2] \u201cMeasuring S-Parameters using millimetre-wave power measurements\u201d, European Microwave Conference, EuMC 2021, Session WS09-EuMC\u2013Workshop, 2021, United Kingdom<\/p>\n [3] “ELENA: un projet europ\u00e9en pour la m\u00e9trologie \u00e9lectrique \u00e0 l\u2019\u00e9chelle nanom\u00e9trique dans l\u2019industrie”, Forum des microscopies \u00e0 sonde locale 2022, March 2022, France<\/p>\n [4] \u00ab\u00a0Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy\u201d, Forum des microscopies \u00e0 sonde locale 2022, March 2022, France<\/p>\n [5] \u201cELENA – a European project for electrical nanoscale metrology in industry: using ellipsometry for quality control of nanoelectronics\u201d, 9th<\/sup> International Conference on Spectroscopic Ellipsometry ICSE, 9th<\/sup> May 2022, China – online<\/p>\n [6] \u201cTraceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy\u201d, AT-AP-RASC 2022, May 2022, Spain<\/p>\n [7] \u201cNanoscale measurements of High Dielectric Constants for piezoelectric materials by Scanning Microwave Microscopy\u201d, E-MRS Spring 2022, May-June 2022, on-line<\/p>\n [8] \u201cElena – a European project for electrical nanoscale metrology in industry\u201d, 3rd plenary session GDR NAME, October 2022, France<\/p>\n [9] \u201cELENA: a European project for electrical nanoscale metrology in industry\u201d, CPEM2022, Dec 2022, New Zealand<\/p>\n [10] \u201cComparison of Matching Networks for Scanning Microwave Microscopy\u201d, CPEM2022, Dec 2022, New Zealand<\/p>\n [11] \u201cAccessing the Loss Tangent of Dielectrics at the Nanoscale: A Novel Approach in Scanning Microwave Microscopy\u201d, CPEM2022, Dec 2022, New Zealand<\/p>\n [12] \u201cNanoscale capacitance calibration using different AFM probes in scanning microwave microscopy\u201d, CPEM2022, Dec 2022, New Zealand<\/p>\n [13] \u201cNondestructive imaging of mobile carriers and trapped charges in delta doped p\u2013n junctions buried in silicon\u201d, Gadest 2022, Sep 2022, Austria<\/p>\n [14] \u201cGraphene Standardization \u2013 Status update and future\u201d, Graphene 2022-Aachen, July 2022, Germany<\/p>\n [15] \u201cELENA: a European project for electrical nanoscale metrology in industry\u201d National GDR NAME meeting, October 2022, France<\/p>\n [16] \u201cMicrowave Sensing in the Modern Society\u201d, IEEE Radio and Wireless Symposium, \u00a02022, United States<\/p>\n [17] \u201cNanorobotics and automated platform for microwave characterization\u00a0 of liquids using coaxial evanescent probe\u201d, Nano, Meso, Micro: Science and Innovation for Radio and Photonic, URSI, 2022, France<\/p>\n [18] \u201cMultiscale Microwave and Millimeter-Wave Nondestructive Testing and Evaluation\u201d, IEEE I2MTC \u2013 International Instrumentation and Measurement Technology, 2022, Canada<\/p>\n [19] \u201cCalibration Six-Port Bas\u00e9e sur une Analyse de Fourier: Extension Record de 250% des Performances Fr\u00e9quentielles\u201d, Journ\u00e9es Nationales Microondes, 2022, France<\/p>\n [20] \u00ab\u00a0Plate-forme robotis\u00e9e et automatis\u00e9e pour la caract\u00e9risation microonde par sonde coaxiale \u00e9vanescente en milieu liquide\u00a0\u00bb, Journ\u00e9es Nationales Microondes, 2022, France<\/p>\n [21] \u00ab\u00a0Instrumentation avanc\u00e9e pour la mod\u00e9lisation et la caract\u00e9risation multi-\u00e9chelles\u00a0\u00bb Colloque LN2 2022, France<\/p>\n [22] \u201cMicrowave Microscopy for Advanced and Efficient Materials Analysis\u201d, IEEE MTT-S International Conference on Electromagnetic and Multiphysics Modeling and Optimization (NEMO2022), Special Session WE3, \u201cElectromagnetic and Multiphysics Multiscale Modelling and Characterization for Advanced and Efficient Materials”, 2022, France<\/p>\n [23] “Quantitative Modeling of Scattering-type Scanning Nearfield Optical Microscope (s-SNOM) with the Finite Element Method Utilizing the Software JCMSuite”, DPG Spring Meeting, 2023, Germany<\/p>\n [24] \u201cELENA: a European project for electrical nanoscale metrology in industry\u201d, International Congress of Metrology (CIM 2023), March 2023, France<\/p>\n [25] \u201cELENA: a European project for electrical nanoscale metrology in industry\u201d, C’nano 2023, March 2023, France<\/p>\n [26] \u00ab\u00a0Evaluation de la robustesse de la m\u00e9thode d\u2019\u00e9talonnage Short Open Load appliqu\u00e9e \u00e0 la mesure de capacit\u00e9 par Scanning Microwave Microscopy\u00a0\u00bb, Forum Microscopie sondes locales, Obernai, April 2023, France<\/p>\n [27] “ELENA: a European project for electrical nanoscale metrology in industry”, Forum Microscopie sondes locales, Obernai, April 2023, France<\/p>\n [28] \u00ab\u00a0Cartographie quantitative de la constante di\u00e9lectrique des nanostructures enterr\u00e9es en microscopie de force \u00e0 sonde Kelvin\u00a0\u00bb, Forum Microscopie sondes locales, Obernai, April 2023, France<\/p>\n [1] K. Kaja, A. Assoum, P. De Wolf, F. Piquemal, A. Nehmee, A. Naja, T. Beyrouthy, and M. Jouiad, \u201cQuantitative Subsurface Measurements of Nano Dielectric Constants using Peak Force Kelvin Probe Force Microscopy and Data Clustering Methods: Towards AFM Dielectric Nano Tomography\u201d, Adv. Mater. Interfaces 2023, 2300503, DOI : 10.1002\/admi.202300503<\/strong><\/a><\/p>\n [2] F. Piquemal, K. Kaja, P. Chr\u00e9tien, J. Mor\u00e1n\u2010Meza, F. Houz\u00e9, C. Ulysse, and A. Harouri, \u201cMulti-Resistance Wide-Range Calibration Sample for Conductive probe Atomic Force Microscopy Measurements\u201d, Beilstein J. Nanotechnol. 2023, 14, 1141-1148 DOI : 10.3762\/bjnano.14.94<\/a><\/strong><\/p>\n [3] D. Richert, D. Deleruyelle, J. A. Mor\u00e1n-Meza, K. Kaja, B. Gautier, and F. Piquemal, \u201dA Fully-Numerical Environment for Evaluating the Robustness of the Short Open Load Calibration for Capacitance Measurements in Scanning Microwave Microscopy\u201d, IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO’2023), DOI: 10.1109\/NEMO56117.2023.10202380<\/a><\/strong><\/p>\n [4] Johannes Hoffmann, Sophie de Pr\u00e9ville, Bruno Eckmann, Hung-Ju Lin, Benedikt Herzog, Kamel Haddadi, Didier Th\u00e9ron, Georg Gramse, Damien Richert, Jos\u00e9 Moran-Meza and Fran\u00e7ois Piquemal \u201cComparison of Impedance Matching Networks for Scanning Microwave Microscopy\u201d,\u00a0IEEE Trans. Instrum. Meas. 2024,\u00a0DOI : 10.1109\/TIM.2024.3378310<\/strong><\/a><\/p>\n [5] Bruno Eckmann, Benedikt Herzog, Hung-Ju Lin, Sophie de Pr\u00e9ville, Johannes Hoffmann and Markus Zeier,\u00a0\u201cCoaxial tips for a scanning microwave microscope and its calibration with dielectric references\u201d,\u00a0Meas. Sci. Technol. 35 (2024) 085010 (9pp),\u00a0DOI : 10.1088\/1361-6501\/ad480d<\/strong><\/a><\/p>\n [6] Dario Siebenkotten, Bernd K\u00e4stner, Manuel Marschall, Arne Hoehl, and Shuhei Amakawa, \u201cCalibration method for complex permittivity measurements using s-SNOM combining multiple probe tapping harmonics\u201d, Optics Express<\/em>, Vol. 32, Issue 13, pp. 23882-23893 (2024), DOI:10.1364\/OE.523785<\/strong><\/a><\/p>\n [7] Damien Richert,\u00a0Damien Deleruyelle,\u00a0Jos\u00e9 A Mor\u00e1n-Meza,\u00a0Khaled Kaja,\u00a0Almazbek Imanaliev,\u00a0Johannes Hoffmann,\u00a0Brice Gautier\u00a0and\u00a0Fran\u00e7ois Piquemal, \u201cA numerical analysis of the short open load calibration robustness for capacitance measurements in scanning microwave microscopy\u201d, 2025\u00a0Meas. Sci. Technol.<\/em>\u00a036<\/strong> 015013, DOI:10.1088\/1361-6501\/ad7e3b<\/a><\/strong><\/p>\n [8] Fran\u00e7ois Piquemal, Pascal Chr\u00e9tien, Jos\u00e9 Mor\u00e1n-Meza, Fr\u00e9d\u00e9ric Houz\u00e9, Alexandra Delvall\u00e9e, Christian Ulysse, Abdelmounaim Harouri, “Calibrating Resistance and Current Measurements in Conductive Probe Atomic Force Microscopy: New Reference Samples and Calibration Methods”, 2024 Phys. Status Solidi A <\/span><\/em>2400711 <\/span>DOI:10.1002\/pssa.202400711<\/strong><\/a><\/p>\n","protected":false},"excerpt":{"rendered":" First Publishable Summary You can check and download our First Publishable Summary. Second Publishable Summary You can check and download our Second Publishable Summary Third Publishable Summary You can check and download our Third Publishable Summary Four Publishable Summary You can check and download our Four Publishable Summary Final Publishable Summary You can check and […]<\/p>\n","protected":false},"author":10,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_genesis_hide_title":false,"_genesis_hide_breadcrumbs":false,"_genesis_hide_singular_image":false,"_genesis_hide_footer_widgets":false,"_genesis_custom_body_class":"","_genesis_custom_post_class":"","_genesis_layout":"","footnotes":""},"class_list":{"0":"post-26","1":"page","2":"type-page","3":"status-publish","5":"entry","6":"gs-1","7":"gs-odd","8":"gs-even","9":"gs-featured-content-entry"},"acf":[],"_links":{"self":[{"href":"https:\/\/projects.lne.eu\/jrp-elena\/wp-json\/wp\/v2\/pages\/26"}],"collection":[{"href":"https:\/\/projects.lne.eu\/jrp-elena\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/projects.lne.eu\/jrp-elena\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/projects.lne.eu\/jrp-elena\/wp-json\/wp\/v2\/users\/10"}],"replies":[{"embeddable":true,"href":"https:\/\/projects.lne.eu\/jrp-elena\/wp-json\/wp\/v2\/comments?post=26"}],"version-history":[{"count":38,"href":"https:\/\/projects.lne.eu\/jrp-elena\/wp-json\/wp\/v2\/pages\/26\/revisions"}],"predecessor-version":[{"id":3115,"href":"https:\/\/projects.lne.eu\/jrp-elena\/wp-json\/wp\/v2\/pages\/26\/revisions\/3115"}],"wp:attachment":[{"href":"https:\/\/projects.lne.eu\/jrp-elena\/wp-json\/wp\/v2\/media?parent=26"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}Second Publishable Summary<\/h2>\n
Third Publishable Summary<\/h2>\n
Four Publishable Summary<\/h2>\n
Final Publishable Summary<\/h2>\n
Good Practice Guides<\/h2>\n
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\nDownload guide<\/a><\/strong><\/li>\n<\/ul>\n\n
\nDownload guide<\/a><\/strong><\/li>\n<\/ul>\nStandards & Regulatory<\/h2>\n
Conferences<\/h2>\n
Papers<\/h2>\n