{"id":26,"date":"2016-10-21T11:04:35","date_gmt":"2016-10-21T09:04:35","guid":{"rendered":"https:\/\/projects.lne.eu\/jrp-hydrogen\/?page_id=26"},"modified":"2022-11-21T16:03:46","modified_gmt":"2022-11-21T15:03:46","slug":"tools-publications","status":"publish","type":"page","link":"https:\/\/projects.lne.eu\/jrp-temmt\/tools-publications\/","title":{"rendered":"Tools \/ publications"},"content":{"rendered":"<h3><strong>REPORT DOCUMENTS<\/strong><\/h3>\n<ul>\n<li><a href=\"https:\/\/projects.lne.eu\/jrp-temmt\/wp-content\/uploads\/sites\/18\/2019\/09\/18SIB09_Publishable_Summary.pdf\">1st-Publishable Summary<\/a><\/li>\n<li><a href=\"https:\/\/projects.lne.eu\/jrp-temmt\/wp-content\/uploads\/sites\/18\/2020\/10\/M9-18SIB09_Publishable_Summary.pdf\">2nd-Publishable Summary<\/a><\/li>\n<li><a href=\"https:\/\/projects.lne.eu\/jrp-temmt\/wp-content\/uploads\/sites\/18\/2021\/11\/18SIB09-TEMMT-M18-Publishable-Summary_accepted-version.pdf\">3rd-Publishable Summary<\/a><\/li>\n<\/ul>\n<h3><strong>STANDARDS &amp; REGULATORY<\/strong><\/h3>\n<p>[1] &#8211; PTB, participation to MTT\/SCC (Standards Coordinating Committee) P287 &#8211; Standard for Precision Coaxial Connectors (DC-110 GHZ), June 2019.<\/p>\n<p>[2] &#8211; PTB, participation to MMTT\/SCC (Standards Coordinating Committee) P2822 Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements, June 2019.<\/p>\n<p>[3] &#8211; NPL, participation to MTT\/SCC (Standards Coordinating Committee) P287 &#8211; Standard for Precision Coaxial Connectors (DC-110 GHZ), January 2020.<\/p>\n<p>[4] &#8211; PTB, participation to MMTT\/SCC (Standards Coordinating Committee) P2822 Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements, January 2020.<\/p>\n<p>[5] &#8211; PTB, participation to DKE mirror committee for IEC\/SC 46F September 2020.<\/p>\n<p>[6] &#8211; PTB, participation to IEC SC 46 committe (RF and microwave passive components) October 2020.<\/p>\n<p>[7] &#8211; PTB, participation to IEC TC 46 committe (Cables, wires, waveguides, RF connectors, RF and microwave passive components and accessories) October 2020.<\/p>\n<p>[8] &#8211; NPL, PTB, ANRITSU, participation to MMTT\/SCC (Standards Coordinating Committee) P2822 Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements, February 2021.<\/p>\n<p>[9] &#8211; NPL, PTB, ANRITSU, participation to MMTT\/SCC (Standards Coordinating Committee) P2822 Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements, May 2021.<\/p>\n<p>[10] &#8211; PTB, participation to IEC SC 46 committe (RF and microwave passive components), November 2020.<\/p>\n<p>[11] &#8211; PTB, participation to IEC TC 46 committe (Cables, wires, waveguides, RF connectors, RF and microwave passive components and accessories), November 2020.<\/p>\n<p>[12] &#8211; PTB, participation to IEC TC 46 committe (Cables, wires, waveguides, RF connectors, RF and microwave passive components and accessories), April 2021.<\/p>\n<p>[13] &#8211; PTB, participation to IEC SC 46 committe (RF and microwave passive components), October 2021.<\/p>\n<p>[14] &#8211; PTB, participation to IEC SC 46 committe (RF and microwave passive components), November 2021.<\/p>\n<p>[15] &#8211; PTB, participation to IEC TC 46 committe (Cables, wires, waveguides, RF connectors, RF and microwave passive components and accessories), November 2021.<\/p>\n<h3><strong>PEER &#8211; REVIEWED PUBLICATIONS<\/strong><\/h3>\n<p>[1] &#8211; R. Judaschke et. al.,\u00a0 &#8220;Comparison of Waveguide and Free-Space Power Measurement in the Millimeter-Wave Range&#8221;, 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), <a href=\"https:\/\/doi.org\/10.1109\/IRMMW-THz.2019.8874235.\">https:\/\/doi.org\/10.1109\/IRMMW-THz.2019.8874235.<\/a><\/p>\n<p>[2] &#8211; A. Kazemipour et. al., &#8220;Material parameter Ext&#8221;, action in THz Domain, Simplifications and Sensitivity Analysis, 2019 Asia-Pacific Microwave Conference (APMC), <a href=\"https:\/\/doi.org\/10.1109\/APMC46564.2019.9038523\">https:\/\/doi.org\/10.1109\/APMC46564.2019.9038523<\/a>.<\/p>\n<p>[3] &#8211; Y. Wang et. al., &#8220;Characterization of Dielectric Materials at WR-15 band (50-75 GHz) using VNA-based Technique&#8221;, IEEE Transactions on Instrumentation and Measurement, <a href=\"https:\/\/doi.org\/10.1109\/TIM.2019.2954010\">https:\/\/doi.org\/10.1109\/TIM.2019.2954010<\/a>.<\/p>\n<p>[4] &#8211; F. Mubarak et. al., &#8220;A Method For Automated Contacting of On-wafer Devices With GSG-probes&#8221;, CPEM 2020 Proceedings.<\/p>\n<p>[5] &#8211; Y. Wang, &#8221; Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration&#8221;, IEEE Transactions on Terahertz Science and Technology, <a href=\"https:\/\/doi.org\/10.1109\/TTHZ.2020.2999631\">https:\/\/doi.org\/10.1109\/TTHZ.2020.2999631<\/a>.<\/p>\n<p>[6] &#8211; N. Ridler, &#8220;Comparing Standardized and Manufacturers\u2019 Interfaces for Waveguides Used at Submillimeter Wavelengths&#8221;, IEEE Transactions on Terahertz Science and Technology, <a href=\"http:\/\/doi.org\/10.1109\/TTHZ.2020.3010122\">http:\/\/doi.org\/10.1109\/TTHZ.2020.3010122<\/a>.<\/p>\n<p>[7] &#8211; A. Kazemipour et. al, &#8220;VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating&#8221;, Proceedings of Conference on Precision Electromagnetic Measurements (CPEM), 2020, <a href=\"https:\/\/doi.org\/10.5281\/zenodo.4243044\">https:\/\/doi.org\/10.5281\/zenodo.4243044<\/a>.<\/p>\n<p>[8] &#8211; A. Kazemipour et. al, &#8220;Analytical Uncertainty Evaluation of Material Parameter Measurements at THz Frequencies&#8221;, Journal of Infrared, Millimeter, and Terahertz Waves, 2020, <a href=\"https:\/\/doi.org\/10.1007\/s10762-020-00723-0\">https:\/\/doi.org\/10.1007\/s10762-020-00723-0<\/a>.<\/p>\n<p>[9] &#8211; Gia Ngoc Phung et. al, &#8220;Parasitic Probe Effects in Measurements of Coplanar Waveguides with Narrow Ground Width&#8221;, Proceedings of IEEE 24th Workshop on Signal and Power Integrity (SPI), 2020, <a href=\"https:\/\/oar.ptb.de\/files\/download\/5f92a12a4c93902ba0000843\">https:\/\/oar.ptb.de\/files\/download\/5f92a12a4c93902ba0000843<\/a>.<\/p>\n<p>[10] N. Ridler, S. Johny, M. Salter, X. Shang, W. Sun, A. Wilson, \u201cEstablishing Waveguide Lines as Primary Standards for Scattering Parameter Measurements at Submillimetre Wavelengths\u201d, in <em>Metrologia<\/em>, vol.\u00a058, no. 1, 2021, <a href=\"https:\/\/doi.org\/10.1088\/1681-7575\/abd371\">https:\/\/doi.org\/10.1088\/1681-7575\/abd371<\/a>.<\/p>\n<p>[11] Ma, X. Shang, N. M. Ridler and W. Wu, &#8220;Assessing the Impact of Data Filtering Techniques on Material Characterization at Millimeter-Wave Frequencies,&#8221; in\u00a0<em>IEEE Transactions on Instrumentation and Measurement<\/em>, vol. 70, pp. 1-4, 2021, Art no. 6005904, <a href=\"https:\/\/doi.org\/10.1109\/TIM.2021.3067224\">https:\/\/doi.org\/10.1109\/TIM.2021.3067224<\/a><\/p>\n<p>[12] A. Kazemipour, J. Hoffmann, M. Wollensack, M. Hudli\u010dka, J. R\u00fcfenacht, D. Stalder, D. Allal, G. G\u00e4umann, M. Zeier, &#8220;Standard Load Method: A New Calibration Technique for Material Characterization at Terahertz Frequencies&#8221;, <em>IEEE Transactions on Instrumentation and Measurement<\/em>, vol 70, 2021, <a href=\"https:\/\/doi.org\/10.1109\/TIM.2021.3077660\">https:\/\/doi.org\/10.1109\/TIM.2021.3077660<\/a>.<\/p>\n<p>[13] M. Celep, D. Stokes, &#8220;Characterization of a Thermal Isolation Section of a Waveguide Microcalorimeter&#8221;, <em>IEEE Transactions on Instrumentation and Measurement<\/em>, vol 70, 2021, <a href=\"https:\/\/doi.org\/10.1109\/TIM.2021.3084306\">https:\/\/doi.org\/10.1109\/TIM.2021.3084306<\/a>.<\/p>\n<p>[14] M. Naftalay, A. Gregory, &#8220;Terahertz and microwave optical properties of single-crystal Quartz and vitreous Silica and the behavior of the boson peak&#8221;, <em>Appl. Sci. 2021<\/em>, 11,<br \/>\n6733, <a href=\"https:\/\/doi.org\/10.3390\/ app11156733\">https:\/\/doi.org\/10.3390\/ app11156733<\/a>.<\/p>\n<p>[15] G. N. Phung and U. Arz, &#8220;Anomalies in multiline-TRL-corrected measurements of short CPW lines,\u201d in <em>96th ARFTG Microwave Measurement Conference (ARFTG)<\/em>, San Diego, CA, USA, 18-22 January 2021, pp. 1-4, \u00a0<a href=\"http:\/\/doi.org\/10.1109\/SPI52361.2021.9505192\">http:\/\/doi.org\/10.1109\/SPI52361.2021.9505192<\/a>.<\/p>\n<p>[16] G. N. Phung and U. Arzy, &#8220;Impact of Chuck Boundary Conditions on Wideband On-Wafer Measurements&#8221;, <em>IEEE 25th Workshop on Signal and Power Integrity (SPI)<\/em>, <a href=\"https:\/\/oar.ptb.de\/files\/download\/618907218e2a000011003f97\">https:\/\/doi.org\/10.3390\/ app11156733<\/a>.<\/p>\n<p>[17] G. N. Phung and U. Arzy, &#8220;On the Influence of Thru- and Line-Length-Related Effects in CPW-Based Multiline TRL Calibrations&#8221;, 9<em>7th ARFTG Microwave Measurement Conference (ARFTG)<\/em>,<a href=\"http:\/\/10.1109\/ARFTG52261.2021.9639909\">10.1109\/ARFTG52261.2021.9639909<\/a>.<\/p>\n<p>[18] G. N. Phung and U. Arzy, &#8220;Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides&#8221;, <em>Kleinheubacher Tagung 2021<\/em>, <a href=\"http:\/\/10.23919\/IEEECONF54431.2021.9598396\">https:\/\/doi.org\/10.3390\/ app11156733<\/a>.<\/p>\n<p>[19] A. Kazemipour, J. Hoffmann, D. Stalder, D. Wollensack, J. Ruefenacht, M. Zeiers, &#8220;THz Detector Calibration Based on Microwave Power Standards&#8221;, <em>International Conference on Electromagnetics in Advanced Applications 2021<\/em>, <a href=\"https:\/\/ieeexplore.ieee.org\/stamp\/stamp.jsp?tp=&amp;arnumber=8879374\">DOI:10.1109\/ICEAA.2019.8879374<\/a>.<\/p>\n<p>[20] M. Salek, M. Celep, T. Weimann, D. Stokes, X. Shang, G. Phung, K. Kuhlmann, J. Skinner, and Y. Wang, &#8220;Design, Fabrication and Characterization of a D Band Bolometric Power Sensor&#8221;, <em>IEEE Transactions on Instrumentation and Measurement<\/em>, vol 71, 2022, <a href=\"https:\/\/ieeexplore.ieee.org\/document\/9733334\">DOI:10.1109\/ICEAA.2019.8879374<\/a>.<\/p>\n<p>[21] M. Celep, M. Salek, D. Stokes, J. Skinner, Y. Wang, &#8220;Power Sensor Characterization from 110 GHz to 170 GHz using a Waveguide Calorimeter&#8221;, <em>IEEE Transactions on Instrumentation and Measurement<\/em>, vol 70, 2021, <a href=\"http:\/\/pure-oai.bham.ac.uk\/ws\/portalfiles\/portal\/159301468\/22_01_IEEE_TIM_110_GHz_170_GHz_Wg_Calorimeter.pdf\" target=\"_blank\" rel=\"noopener\">10.1109\/TIM.2022.3144209<\/a>.<\/p>\n<p>[22] . Bystrov, Y. Wang, P. Gardner, &#8220;Analysis of Vector Network Analyzer Thermal Drift Error&#8221;, <em>Metrology<\/em>, vol 71, 2022, <a href=\"https:\/\/doi.org\/10.3390\/metrology2020010\" target=\"_blank\" rel=\"noopener\">10.1109\/TIM.2022.3144209<\/a>.<\/p>\n<p>[23] . J.Krupka, T.Karpisz, B.Salski, P.Kopyt, L.Jensen, M.Wojciechowski, &#8220;Irradiated silicon for microwave and millimeter wave applications&#8221;, <em>IEEE Microwave and Wireless Components Letters<\/em>, vol 732, 2022, <a href=\"https:\/\/ieeexplore.ieee.org\/document\/9756203\" target=\"_blank\" rel=\"noopener\">10.1109\/LMWC.2022.3161393<\/a>.<\/p>\n<p>[24] . J.Krupka, T.Karpisz, B.Salski, P.Kopyt and M.Wojciechowski , &#8220;Measurement of Uniaxially Anisotropic Dielectrics With a Fabry\u2013Perot Open Resonator in the 20\u201350 GHz Range&#8221;, <em>IEEE Microwave and Wireless Components Letters<\/em>, vol 32, 2022, <a href=\"https:\/\/doi.org\/10.5281\/zenodo.7071325\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.5281\/zenodo.7071325<\/a>.<\/p>\n<p>[25] . G. N. Phung, U. Arz , &#8220;On the Influence of Metal Chucks in Wideband On-Wafer Measurements&#8221;, <em>Proceedings of\u00a0 98th ARFTG Microwave Measurement Conference<\/em>, 2022.<\/p>\n<p>[26] . G. N. Phung, U. Arz, W. Heinrich, &#8220;Comparison of coplanar waveguide models at millimetre wave frequencies&#8221;, <em>Proceedings of\u00a0 IEEE 26th Workshop on Signal and Power Integrity (SPI)<\/em>, 2022.<\/p>\n<p>[27] M. Celep, G. N. Phung, F. Ziad\u00e9, D. Stokes, J. R\u00fchaak, K. Kuhlmann, D. Allal, &#8220;WG29\/WR7 Band Thermoelectric Power Sensor Characterization using Microcalorimetry Technique&#8221;, <em>Proceedings of IEEE\/MTT-S International Microwave Symposium 2022<\/em>, 2022, <a href=\"https:\/\/doi.org\/10.5281\/zenodo.7303596\" target=\"_blank\" rel=\"noopener\">https:\/\/doi.org\/10.5281\/zenodo.7303596<\/a>.<\/p>\n<h3><strong>CONFERENCES<\/strong><\/h3>\n<p>[1] &#8211; &#8220;Comparison of Waveguide and Free-Space Power Measurement in the Millimeter-Wave Range&#8221;, 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), September 2019, France.<\/p>\n<p>[2] &#8211; &#8220;THz Detector Calibration Based on Microwave Power Standards&#8221;, 2019 International Conference on Electromagnetics in Advanced Applications (ICEAA), September 2019, Spain.<\/p>\n<p>[3] &#8211; &#8220;Material parameter Extraction in THz Domain, Simplifications and Sensitivity Analysis&#8221;, 2019 Asia-Pacific Microwave Conference (APMC), December 2019.<\/p>\n<p>[4] &#8211; &#8220;Feasibility of Accurate Power Measurement in Submillimeter\/mm-Wave Domain&#8221;, The 12th UK\/Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) 2019, August 2019, United Kingdom.<\/p>\n<p>[5] &#8211; &#8220;Generation and measurement of traceable THz frequencies&#8221;, 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), September 2019, France.<\/p>\n<p>[6] &#8211; &#8220;Measurements of S-parameters and material properties at millimetre-wave and terahertz frequencies&#8221;, The 12th UK\/Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) 2019, August 2019, United Kingdom.<\/p>\n<p>[7] &#8211; &#8220;Dielectric properties of materials at THz and sub-THz frequencies&#8221;, Towards Terahertz Technology for High Throughput Communication, February 2020, Switzerland.<\/p>\n<p>[8] &#8211; &#8220;Building a national measurement capability for the millimetre and submillimetre-wave frequency ranges&#8221;, UK-Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) 2020, August 2020, China.<\/p>\n<p>[9] &#8211; &#8220;Measurements of S-parameters and characterisation of dielectric materials at millimetre-wave and terahertz frequencies&#8221;, UK-Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) 2020, August 2020, China.<\/p>\n<p>[10] &#8211; &#8220;Comparing measurements of millimetre-wave power in W-band rectangular waveguide&#8221;, UK-Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) 2020, August 2020, China.<\/p>\n<p>[11] &#8211; &#8220;Automated Contacting of On-wafer Devices for RF Testing&#8221;, Conference on Precision Electromagnetic Measurements 2020 (CPEM), August 2020, United States.<\/p>\n<p>[12] &#8211; &#8220;Parasitic Probe Effects in Measurements of Coplanar Waveguides with Narrow Ground Width&#8221;, 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI), May 2020, Germany.<\/p>\n<p>[13] &#8211; &#8220;VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating&#8221;, Conference on Precision Electromagnetic Measurements 2020 (CPEM), August 2020, United States.<\/p>\n<p>[14] &#8211; \u201cAnomalies in multiline-TRL-corrected measurements of short CPW lines,\u201d 96th ARFTG Microwave Measurement Conference (ARFTG), 2021, United States.<\/p>\n<p>[15] &#8211; \u201cOn the Influence of Thru- and Line-Length-Related Effects in CPW-Based Multiline TRL Calibrations\u201d,97th ARFTG Microwave Measurement Conference (ARFTG), 2021, United States.<\/p>\n<p>[16] &#8211; \u201cImpact of Chuck Boundary Conditions on Wideband On-Wafer Measurements\u201d, 25th IEEE Workshop on Signal and Power Integrity (SPI), 2021 Online conference.<\/p>\n<p>[17 ] &#8211; \u201cImpact of GSG Probe to Pads Contact Repeatability for On-Wafer RF Measurements\u201d, EEE 7th International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA 2021), August 2021, Indonesia.<\/p>\n<p>[18] &#8211; \u201cInvestigation of Low Terahertz Vector Network Analyzer Thermal Drift Error\u201d, International Conference on Electromagnetic Metrology (ICEM) 2021, November 2021, Italy.<\/p>\n<p>[19] &#8211; \u201cParasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides\u201d, Kleinheubacher Tagung 2021, September 2021, Germany.<\/p>\n<p>[20] &#8211; \u201cCalibration of RF power at D-Band\u201d, Kleinheubacher Tagung 2021, September 2021, Germany.<\/p>\n<p>[21] &#8211; \u201cWG29\/WR7 Band Thermoelectric Power Sensor Characterization using Microcalorimetry Technique\u201d, IMS 2022, June 2022, Denver.<\/p>\n<p>[22] &#8211; \u201cScanning Electron Microscopy Applied to Coaxial Air Lines Calibration\u201d, CPEM 2022, December 2022, Wellington.<\/p>\n<p>[23] &#8211; \u201cOn the Influence of Metal Chucks in Wideband On-Wafer Measurements\u201d, 98th ARFTG Microwave Measurement Conference, January 2022, United States.<\/p>\n<p>[24] &#8211; \u201cComparison of coplanar waveguide models at millimetre wave frequencies\u201d, 2022 IEEE 26th Workshop on Signal and Power Integrity (SPI), May 2022, Germany.<\/p>\n<p>[25] &#8211; \u201cParasitic Coupling Effects in Coplanar Short Measurements\u201d, 99th ARFTG Microwave Measurement Conference, June 2022, United States.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>REPORT DOCUMENTS 1st-Publishable Summary 2nd-Publishable Summary 3rd-Publishable Summary STANDARDS &amp; REGULATORY [1] &#8211; PTB, participation to MTT\/SCC (Standards Coordinating Committee) P287 &#8211; Standard for Precision Coaxial Connectors (DC-110 GHZ), June 2019. [2] &#8211; PTB, participation to MMTT\/SCC (Standards Coordinating Committee) P2822 Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements, June 2019. [&hellip;]<\/p>\n","protected":false},"author":26,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_genesis_hide_title":false,"_genesis_hide_breadcrumbs":false,"_genesis_hide_singular_image":false,"_genesis_hide_footer_widgets":false,"_genesis_custom_body_class":"","_genesis_custom_post_class":"","_genesis_layout":"","footnotes":""},"class_list":{"0":"post-26","1":"page","2":"type-page","3":"status-publish","5":"entry","6":"gs-1","7":"gs-odd","8":"gs-even","9":"gs-featured-content-entry"},"acf":[],"_links":{"self":[{"href":"https:\/\/projects.lne.eu\/jrp-temmt\/wp-json\/wp\/v2\/pages\/26"}],"collection":[{"href":"https:\/\/projects.lne.eu\/jrp-temmt\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/projects.lne.eu\/jrp-temmt\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/projects.lne.eu\/jrp-temmt\/wp-json\/wp\/v2\/users\/26"}],"replies":[{"embeddable":true,"href":"https:\/\/projects.lne.eu\/jrp-temmt\/wp-json\/wp\/v2\/comments?post=26"}],"version-history":[{"count":27,"href":"https:\/\/projects.lne.eu\/jrp-temmt\/wp-json\/wp\/v2\/pages\/26\/revisions"}],"predecessor-version":[{"id":2603,"href":"https:\/\/projects.lne.eu\/jrp-temmt\/wp-json\/wp\/v2\/pages\/26\/revisions\/2603"}],"wp:attachment":[{"href":"https:\/\/projects.lne.eu\/jrp-temmt\/wp-json\/wp\/v2\/media?parent=26"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}