Tools / publications
REPORT DOCUMENTS
Good Practice Guide
[1] Good practice guide for calibrated capacitance measurements using scanning microwave microscopy.
STANDARDS & REGULATORY
[1] – M. Cain, “Presentation of Consortium activities/ research results“, IEEE UFFC – Ultrasonics, Ferroelectrics and Frequency Control Society , USA, May 2018.
[2] – M. Cain, “Presentation of Consortium activities/ research results“, IEEE UFFC – Technical Working Areas (TWA) 24 Performance Related Properties of Electroceramics , USA, May 2019.
[3] – M. Cain, “General participation in the committee“, ISO TC 206 Fine Ceramics , USA, June 2019.
[4] – M. Cain, “Presentation of consortium activities/ research results“, (UFFC) Ultrasonics, Ferroelectrics and Frequency Control Society , USA, May 2019.
PEER – REVIEWED PUBLICATIONS
[1] – B. Kästner, F. Schmähling, A. Hornemann, G. U., A. Hoehl, M.s Kruskopf, K.s Pierz, M. B. Raschke, G. Wübbeler, and C. Elster, “Compressed sensing FTIR nano-spectroscopy and nano-imaging”, Optic Express, April 2018, https://doi.org/10.1364/OE.26.018115.
[2] – B. Kästner, C. M. Johnson, P. Hermann, M. Kruskopf, K. Pierz, A. Hoehl, A. Hornemann, G. Ulrich, J. Fehmel, P. Patoka, E. Rühl, and G. Ulm, “Infrared Nanospectroscopy of Phospholipid and Surfactin Monolayer”, ACS Omega, April 2018, https://pubs.acs.org/doi/10.1021/acsomega.7b01931
[3] – T. Le Quang, D. Vasyukov, J. Hoffmann, A. Buchter, M. Zeier, “Fabrication and Measurements of Inductive Devices for Scanning Microwave Microscopy”, IEEE-Nano, July 2019, DOI: 10.1109/NANO46743.2019.8993943
[4] – I. D. Barcelos, H. A. Bechtel, C. J. S. de Matos, D. A. Bahamon, B. Kaestner, F. C. B. Maia and R. O. Freitas, “Probing Polaritons in 2D Materials with Synchrotron”, December 2019, https://doi.org/10.1002/adom.201901091
[5] – D. Kendig, H. Votsi, J Urbonas, C. Matei, P. H. Aaen “Dynamic Temperature Measurements of a GaN DC/DC Boost Converter at MHz Frequencies”, IEEE Transactions on Power Electronics, January 2020, DOI: 10.1109/TPEL.2020.2964996, OA link: http://epubs.surrey.ac.uk/853825/
[6] – M. Staruch, H. ElBidweihy, M. G. Cain, P. Thompson, C. A. Lucas, and P. Finkel, “Magnetic and multiferroic properties of dilute Fe-doped BaTiO3 crystals”, March 2020, http://dx.doi.org/10.1063/5.0002863
[7] – J. A Moran-Meza, A. Delvallée, D. Allal, F. Piquemal, “A substitution method for nanoscale capacitance calibration using scanning microwave microscopy”, April 2020, https://doi.org/10.1088/1361-6501/ab82c1
[8] – M. Wansleben, J. Vinson, A. Wählisch, K. Bzheumikhova, P. Hönicke, B. Beckhoff, and Y. Kayser, “Speciation of FeS and FeS2 by means of X-ray Emission Spectroscopy using a compact full-cylinder von Hamos spectrometer”, May 2020 , https://arxiv.org/abs/2005.09509
[9] – M. A. Azpúrua, M. Pous, F. Silva, “ncertainty Analysis in the Measurement of Switching Losses in GaN FETs Power Converters”, 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 220, 10.1109/I2MTC43012.2020.9129552.
[10] – E. A. Patterson, M. Staruch, B. R. Matis, S. Young, S. E. Lofland, L. Antonelli, F. Blackmon, D. Damjanovic, M. G. Cain, P. B. J. Thompson, C. A. Lucas, and P. Fink, , “Dynamic piezoelectric response of relaxor single crystal under electrically driven inter-ferroelectric phase transformations”, June 2020, https://aip.scitation.org/doi/pdf/10.1063/5.0007820
[11] – M. Cain, M. Staruch, P. Thompson, C. Lucas, D. Wermeille, Y. Kayser, B. Beckhoff, S.Loafland, P. Finkel, “In situ electric-field study of surface effects in domain engineered Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 relaxor crystals by grazing incidence diffraction”, September 2020, doi:10.3390/cryst10090728
CONFERENCES
[1] – J. Carlos, A. Goncalves, I. ALAJI, D. Gloria, V. Gidel, F. Gianesello, S. Lepilliet, G. Ducournau, F. Danneville, C. Gaquière, “On wafer millimetre wave power detection using a PN junction diode in BiCMOS 55 nm for in-situ large signal characterization”, EuMW 2018, September 2018.
[2] – M. Hytch, “Investigating the potential of SiGe Diode in BiCMOS 55nm for power detection and datacom applications at 300 GHz”, IRMMW -2018, September 2018
[3] – M. Hytch “In operando electron holography study of working nanocapacitors”, International Microscopy Congress (IMC16), September 2018.
[4] – J. Hoffmann, “COMSOL® Simulation for Scanning Microwave Microscopic Experiments”, Comsol conference”, October 2018.
[5] – M. Cain, P. Finkel, M. Staruch, P. Thompson, D. Wermeille, “In situ study of inter-ferroelectric phase transitions in domain engineered ferroic crystals”, MRS Fall 2018, November 2018.
[6] – P. Klapetek “Fast mechanical model for probe-sample heat transfer calculations in Scanning Thermal Microscopy”, NHMT-VI, December 2018.
[7] – J. A Moran-Meza, A. Delvallée, D. Allal, F. Piquemal, “Capacitance measurements at nanoscale with scanning microwave microscopy (SMM)”, C’Nano2018: The Nanoscience meeting, December 2018.
[8] – J. onas Urbonas, Cristian Matei, Peter Aaen, “Transient and Steady-State Thermal Measurements of GaN-on-SiC HEMT Transistors Under Realistic Microwave Drive Conditions”, 92nd ARFTG Microwave Measurement Conference, January 2019.
[9] – J. A Moran-Meza, A. Delvallée, D. Allal, F. Piquemal, “Mesures de capacités par microscopie Micro-onde à champ proche (SMM)”, 22ème Forum des Microscopies à Sondes Locales, March 2019.
[10] – M. Hytch, “Measuring electric fields in operando devices by electron holography”, MSM XXI, April 2019.
[11] – M. Cain, “In situ study of inter-ferroelectric phase transitions in domain engineered ferroic crystals”, 2019 Workshop On Accoustic Transduction Materials and Devices, May 2019.
[12] I. Alaji, “Détection de puissance sur wafer à l’aide de diode PN pour les applications TH”, National Journées National Microondes, May 2019.
[13] – J. M. Moran, A. Delvallée, D. Allal, F. Piquemal “Capacitance mapping at nanoscale by scanning microwave microscopy (SMM): Metrological aspects”, European Materials Research Society – Spring Meeting 2019, May 2019.
[14] – T. Le Quang, D. Vasyukov, J. Hoffmann, A. Buchter, M. Zeier “Impedance Standards for Scanning Microwave Microscopy”, Nano Metrology 2019, June 2019.
[15] – M. Hytch, “In-situ electron holography with the I2TEM (HF3300-C) microscope”, Inauguration of Hitachi HF5000 at Fraunhofer Halle, June 2019.
[16] – T. Le Quang, D. Vasyukov, J. Hoffmann, A. Buchter, M. Zeier, “Fabrication and Measurements of Inductive Devices for Scanning Microwave Microscopy”, IEEE Nano 2019, July 2019.
[17] – M. Cain , M. Staruch, P. Finkel, P. Thompson, D. Wermeille, “In situ study of inter- ferroelectric phase transitions in domain engineered ferroic crystals”, Joint 2019 f2c????2 Conference, July 2019.
[18] – M. Staruch, H. H. A. ElBidweihy, M. Cain, P. Thompson, P. Finkel, “Magnetic and Multiferroic Behavior in Fe Doped BaTiO3 Single Crystals”, Joint 2019 f2c????2 Conference, July 2019.
[19] – H. Votsi, J. Urbonas, P. H. Aaen “Experimental Verification and Imaging of Radiation Due to Coaxial-to-Microstrip Transitions”, 93rd ARFTG Microwave Measurement Conference”, July 2019.
[20] – “Computational scattering-type near-field optical microscopy”, 10th International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, September 2019.
[21] – J. M. Moran, A. Delvallée, D. Allal, F. Piquemal ,“A substitution method for capacitance calibration using scanning microwave microscopy”, NanoScale2019, 12th Seminar on Quantitative Microscopy (QM) & 8th Seminar on nanoscale Calibration Standards and Methods, October 2019.
[22] – Y. Kaiser, “Towards operando EXAFS investigations of advanced piezoelectric materials”, PRORA November 2019.
[23] – Y. Kaiser, “Towards operando EXAFS investigations of advanced piezoelectric materials National BESSY User Meeting”, December 2019.
[24] – M. Cain, “LIMM Analysis of Novel Lead-Free Pyroelectric Materials for IR Array Detectors”, ISAF 2020, July 2020.
[25] – I. Kolevatov, B. Karlsen, K. B. Ellingsberg, T. Sørsdal, H. Malmbekk “In-circuit current Measurements with a frequency above 1 MHz: a shunt based on active Components”, CPEM 2020, August 2020.
[26] – “Photocurrent nanoscopy of domain switching in collinear antiferromagnet CuMnAs“, NFO 16, August 2020.
WORKSHOPS – SEMINARS:
[1] – CNRS, “In-situ biasing for electron holography experiments of nanodevices”, Holography Workshop, Germany, June 2018.
[2] – Xiaobang Shang, Nick Ridler, Peter Aaen, “Multi-physics characterisation of RF components for advanced energy-saving technology in 5G and IoT“, Keysight Industrial Seminar on Next-generation Electronics Applications for 5G Communications , University of SURREY, United Kingdom, July 2018.
[3] – Jonas Urbonas, Critian Matei, Peter Aaen , “Advances in Electrothermal and Electro-optic Characterization of Microwave Power Amplifiers“, Keysight Industrial Seminar on Next-generation Electronics Applications for 5G Communications , University of SURREY, United Kingdom, July 2018.
[4] – François Ziadé, “ADVENT Project Overview“, AREMIF (Microwave Network Ile de France) meeting, Paris, France, June 2018.
[5] – François Ziadé, “European Project in Metrology to support energy saving technology: overview and focus on microwave power measurements”, X-ray and neutron scattering and spectroscopies in ferroelectric and multiferroic research workshop V, London, United Kingdom, February 2019.
[6] – Martin Hytch, “Challenges of in-situ characterisation of ferroelectric thin films by transmission electron microscopy”, X-ray and neutron scattering and spectroscopies in ferroelectric and multiferroic research workshop V, London, United Kingdom, February 2019.
[7] – Yves Kaiser, “Towards operando EXAFS investigations of advanced piezoelectric materials”, X-ray and neutron scattering and spectroscopies in ferroelectric and multiferroic research workshop V, London, United Kingdom, February 2019.
[8] – Markys Cain, “In situ synchrotron X-ray diffraction stress-induced phase transitions in ferroelectric materials – new capability at the XMaS beamline at the ESRF”, X-ray and neutron scattering and spectroscopies in ferroelectric and multiferroic research workshop V, London, United Kingdom, February 2019.
[9] – Bernd Kästner, Franko Schmähling, Andrea Hornemann, Georg Ulrich, Arne Hoehl, Mattias Kruskopf, Klaus Pierz, Gerd Wübbeler, and Clemens Elster, Samuel Johnson, and Markus B. Raschke , “Computational scattering-type near-field optical microscopy”, 10th International Workshop on Infrared Microscopy and spectroscopy with Accelerator Based Sources, Campinas, Brazil, September 2019.
[10] – F.Ziadé, “Key energy figures in ICT sector and main aspect of the top – down approach adopted in the European Project in Metrology ADVENT “, EuMW 2019, Paris , September 2019.
[11] -K., R.Judaschke, F. Gellersen, “Traceable RF power measurements at PTB – an overview “, EuMW 2019, Paris , September 2019.
[12] – I. Alaji, D. Gloria, G. Ducournau, C. Gaquière, “Power detection based on Silicon Schottky diode for 5G applications “, EuMW 2019, Paris , September 2019.
[13] – D. Allal, F. Ziadé, “Calibration of on chip microwave power sensors “, EuMW 2019, Paris , September 2019.
[14] – B., H. Takhedmit, E. Richalot, J-M. Laheurte, “Power Loss Estimation in RF Circuits Based on Magnetic Near-Field Measurements “, EuMW 2019, Paris , September 2019.
[15] – D. Stalder, M. Wollensack, J. Hoffmann, M. Zeier, F.Ziadé, “Power Traceable Noise Temperature Calibration Based on RF-Power“, EuMW 2019, Paris , September 2019.
[16] – X. Shang, N. Ridler, “Calibration techniques for on-chip S-parameter measurements“, EuMW 2019, Paris , September 2019.
[17] – M. Salter, “Uncertainties in VNA and NVNA measurements“, EuMW 2019, Paris , September 2019.
[18] – H. Votsi, P. H.Aaen, “Multiphysics microwave characterisation of GaN power transistors“, EuMW 2019, Paris , September 2019.
[19] – M. Azpurua, M. Pous, F. Silva, “Challenges and techniques for measuring high-speed switching waveforms in GaN power converters“, EuMW 2019, Paris , September 2019.
[20] – T. Le Quang, D. Vasyukov, J. Hoffmann, A. Buchter, M. Zeier , “Design and Simulation of Impedance Standards for Scanning Microwave Microscopes“, EuMW 2019, Paris , September 2019.
[21] – J. Moran, F. Piquemal, “Metrology for capacitance measurements using Scanning Microwave Microscope“, EuMW 2019, Paris , September 2019.
OTHER – DISSEMINATIONS:
[1] – Newsletter, XMas Newsletter 2017, Feb 2018 2018.
https://warwick.ac.uk/fac/cross_fac/xmas/impact/newsletters/
[2] – Article published in professional journal, MET Info, Vol. 25 No. 1, 2018.
[3] – Article published in professional journal, Synchrotron Radiation News, April 2018.
[4] – Seminar, Collaboration ADVENT – ACSIEL ALLIANCE ELECTRONIQUE, April 2018.
[5 ] – Event, Presentation for Project Advisory Group members and collaborators teleconference, April 2018.
[6] – Article published in professional journal, METinfo, May 2018.
[7] – Seminar, 2018 International Workshop on Acoustic Transduction Materials and Devices, May 2018
[8] – Seminar, 2018 International Workshop on Acoustic Transduction Materials and Devices, May 2018
[9] – Article published in professional journal, SI-Traceable Analysis of Nanomaterials by X-ray Spectrometry, Juluy 2018.
[10] – Newsletter, Club nanoMetrologie Newsletter N°10, September 2018.