Tools / publications
REPORT DOCUMENTS
STANDARDS & REGULATORY
[1] – PTB, participation to MTT/SCC (Standards Coordinating Committee) P287 – Standard for Precision Coaxial Connectors (DC-110 GHZ), June 2019.
[2] – PTB, participation to MMTT/SCC (Standards Coordinating Committee) P2822 Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements, June 2019.
[3] – NPL, participation to MTT/SCC (Standards Coordinating Committee) P287 – Standard for Precision Coaxial Connectors (DC-110 GHZ), January 2020.
[4] – PTB, participation to MMTT/SCC (Standards Coordinating Committee) P2822 Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements, January 2020.
[5] – PTB, participation to DKE mirror committee for IEC/SC 46F September 2020.
[6] – PTB, participation to IEC SC 46 committe (RF and microwave passive components) October 2020.
[7] – PTB, participation to IEC TC 46 committe (Cables, wires, waveguides, RF connectors, RF and microwave passive components and accessories) October 2020.
[8] – NPL, PTB, ANRITSU, participation to MMTT/SCC (Standards Coordinating Committee) P2822 Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements, February 2021.
[9] – NPL, PTB, ANRITSU, participation to MMTT/SCC (Standards Coordinating Committee) P2822 Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements, May 2021.
[10] – PTB, participation to IEC SC 46 committe (RF and microwave passive components), November 2020.
[11] – PTB, participation to IEC TC 46 committe (Cables, wires, waveguides, RF connectors, RF and microwave passive components and accessories), November 2020.
[12] – PTB, participation to IEC TC 46 committe (Cables, wires, waveguides, RF connectors, RF and microwave passive components and accessories), April 2021.
[13] – PTB, participation to IEC SC 46 committe (RF and microwave passive components), October 2021.
[14] – PTB, participation to IEC SC 46 committe (RF and microwave passive components), November 2021.
[15] – PTB, participation to IEC TC 46 committe (Cables, wires, waveguides, RF connectors, RF and microwave passive components and accessories), November 2021.
PEER – REVIEWED PUBLICATIONS
[1] – R. Judaschke et. al., “Comparison of Waveguide and Free-Space Power Measurement in the Millimeter-Wave Range”, 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), https://doi.org/10.1109/IRMMW-THz.2019.8874235.
[2] – A. Kazemipour et. al., “Material parameter Ext”, action in THz Domain, Simplifications and Sensitivity Analysis, 2019 Asia-Pacific Microwave Conference (APMC), https://doi.org/10.1109/APMC46564.2019.9038523.
[3] – Y. Wang et. al., “Characterization of Dielectric Materials at WR-15 band (50-75 GHz) using VNA-based Technique”, IEEE Transactions on Instrumentation and Measurement, https://doi.org/10.1109/TIM.2019.2954010.
[4] – F. Mubarak et. al., “A Method For Automated Contacting of On-wafer Devices With GSG-probes”, CPEM 2020 Proceedings.
[5] – Y. Wang, ” Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration”, IEEE Transactions on Terahertz Science and Technology, https://doi.org/10.1109/TTHZ.2020.2999631.
[6] – N. Ridler, “Comparing Standardized and Manufacturers’ Interfaces for Waveguides Used at Submillimeter Wavelengths”, IEEE Transactions on Terahertz Science and Technology, http://doi.org/10.1109/TTHZ.2020.3010122.
[7] – A. Kazemipour et. al, “VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating”, Proceedings of Conference on Precision Electromagnetic Measurements (CPEM), 2020, https://doi.org/10.5281/zenodo.4243044.
[8] – A. Kazemipour et. al, “Analytical Uncertainty Evaluation of Material Parameter Measurements at THz Frequencies”, Journal of Infrared, Millimeter, and Terahertz Waves, 2020, https://doi.org/10.1007/s10762-020-00723-0.
[9] – Gia Ngoc Phung et. al, “Parasitic Probe Effects in Measurements of Coplanar Waveguides with Narrow Ground Width”, Proceedings of IEEE 24th Workshop on Signal and Power Integrity (SPI), 2020, https://oar.ptb.de/files/download/5f92a12a4c93902ba0000843.
[10] N. Ridler, S. Johny, M. Salter, X. Shang, W. Sun, A. Wilson, “Establishing Waveguide Lines as Primary Standards for Scattering Parameter Measurements at Submillimetre Wavelengths”, in Metrologia, vol. 58, no. 1, 2021, https://doi.org/10.1088/1681-7575/abd371.
[11] Ma, X. Shang, N. M. Ridler and W. Wu, “Assessing the Impact of Data Filtering Techniques on Material Characterization at Millimeter-Wave Frequencies,” in IEEE Transactions on Instrumentation and Measurement, vol. 70, pp. 1-4, 2021, Art no. 6005904, https://doi.org/10.1109/TIM.2021.3067224
[12] A. Kazemipour, J. Hoffmann, M. Wollensack, M. Hudlička, J. Rüfenacht, D. Stalder, D. Allal, G. Gäumann, M. Zeier, “Standard Load Method: A New Calibration Technique for Material Characterization at Terahertz Frequencies”, IEEE Transactions on Instrumentation and Measurement, vol 70, 2021, https://doi.org/10.1109/TIM.2021.3077660.
[13] M. Celep, D. Stokes, “Characterization of a Thermal Isolation Section of a Waveguide Microcalorimeter”, IEEE Transactions on Instrumentation and Measurement, vol 70, 2021, https://doi.org/10.1109/TIM.2021.3084306.
[14] M. Naftalay, A. Gregory, “Terahertz and microwave optical properties of single-crystal Quartz and vitreous Silica and the behavior of the boson peak”, Appl. Sci. 2021, 11,
6733, https://doi.org/10.3390/ app11156733.
[15] G. N. Phung and U. Arz, “Anomalies in multiline-TRL-corrected measurements of short CPW lines,” in 96th ARFTG Microwave Measurement Conference (ARFTG), San Diego, CA, USA, 18-22 January 2021, pp. 1-4, http://doi.org/10.1109/SPI52361.2021.9505192.
[16] G. N. Phung and U. Arzy, “Impact of Chuck Boundary Conditions on Wideband On-Wafer Measurements”, IEEE 25th Workshop on Signal and Power Integrity (SPI), https://doi.org/10.3390/ app11156733.
[17] G. N. Phung and U. Arzy, “On the Influence of Thru- and Line-Length-Related Effects in CPW-Based Multiline TRL Calibrations”, 97th ARFTG Microwave Measurement Conference (ARFTG),10.1109/ARFTG52261.2021.9639909.
[18] G. N. Phung and U. Arzy, “Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides”, Kleinheubacher Tagung 2021, https://doi.org/10.3390/ app11156733.
[19] A. Kazemipour, J. Hoffmann, D. Stalder, D. Wollensack, J. Ruefenacht, M. Zeiers, “THz Detector Calibration Based on Microwave Power Standards”, International Conference on Electromagnetics in Advanced Applications 2021, DOI:10.1109/ICEAA.2019.8879374.
[20] M. Salek, M. Celep, T. Weimann, D. Stokes, X. Shang, G. Phung, K. Kuhlmann, J. Skinner, and Y. Wang, “Design, Fabrication and Characterization of a D Band Bolometric Power Sensor”, IEEE Transactions on Instrumentation and Measurement, vol 71, 2022, DOI:10.1109/ICEAA.2019.8879374.
[21] M. Celep, M. Salek, D. Stokes, J. Skinner, Y. Wang, “Power Sensor Characterization from 110 GHz to 170 GHz using a Waveguide Calorimeter”, IEEE Transactions on Instrumentation and Measurement, vol 70, 2021, 10.1109/TIM.2022.3144209.
[22] . Bystrov, Y. Wang, P. Gardner, “Analysis of Vector Network Analyzer Thermal Drift Error”, Metrology, vol 71, 2022, 10.1109/TIM.2022.3144209.
[23] . J.Krupka, T.Karpisz, B.Salski, P.Kopyt, L.Jensen, M.Wojciechowski, “Irradiated silicon for microwave and millimeter wave applications”, IEEE Microwave and Wireless Components Letters, vol 732, 2022, 10.1109/LMWC.2022.3161393.
CONFERENCES
[1] – “Comparison of Waveguide and Free-Space Power Measurement in the Millimeter-Wave Range”, 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), September 2019, France.
[2] – “THz Detector Calibration Based on Microwave Power Standards”, 2019 International Conference on Electromagnetics in Advanced Applications (ICEAA), September 2019, Spain.
[3] – “Material parameter Extraction in THz Domain, Simplifications and Sensitivity Analysis”, 2019 Asia-Pacific Microwave Conference (APMC), December 2019.
[4] – “Feasibility of Accurate Power Measurement in Submillimeter/mm-Wave Domain”, The 12th UK/Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) 2019, August 2019, United Kingdom.
[5] – “Generation and measurement of traceable THz frequencies”, 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), September 2019, France.
[6] – “Measurements of S-parameters and material properties at millimetre-wave and terahertz frequencies”, The 12th UK/Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) 2019, August 2019, United Kingdom.
[7] – “Dielectric properties of materials at THz and sub-THz frequencies”, Towards Terahertz Technology for High Throughput Communication, February 2020, Switzerland.
[8] – “Building a national measurement capability for the millimetre and submillimetre-wave frequency ranges”, UK-Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) 2020, August 2020, China.
[9] – “Measurements of S-parameters and characterisation of dielectric materials at millimetre-wave and terahertz frequencies”, UK-Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) 2020, August 2020, China.
[10] – “Comparing measurements of millimetre-wave power in W-band rectangular waveguide”, UK-Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) 2020, August 2020, China.
[11] – “Automated Contacting of On-wafer Devices for RF Testing”, Conference on Precision Electromagnetic Measurements 2020 (CPEM), August 2020, United States.
[12] – “Parasitic Probe Effects in Measurements of Coplanar Waveguides with Narrow Ground Width”, 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI), May 2020, Germany.
[13] – “VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating”, Conference on Precision Electromagnetic Measurements 2020 (CPEM), August 2020, United States.
[14] – “Anomalies in multiline-TRL-corrected measurements of short CPW lines,” 96th ARFTG Microwave Measurement Conference (ARFTG), 2021, United States.
[15] – “On the Influence of Thru- and Line-Length-Related Effects in CPW-Based Multiline TRL Calibrations”,97th ARFTG Microwave Measurement Conference (ARFTG), 2021, United States.
[16] – “Impact of Chuck Boundary Conditions on Wideband On-Wafer Measurements”, 25th IEEE Workshop on Signal and Power Integrity (SPI), 2021 Online conference.
[17 ] – “Impact of GSG Probe to Pads Contact Repeatability for On-Wafer RF Measurements”, EEE 7th International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA 2021), August 2021, Indonesia.
[18] – “Investigation of Low Terahertz Vector Network Analyzer Thermal Drift Error”, International Conference on Electromagnetic Metrology (ICEM) 2021, November 2021, Italy.
[19] – “Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides”, Kleinheubacher Tagung 2021, September 2021, Germany.
[20] – “Calibration of RF power at D-Band”, Kleinheubacher Tagung 2021, September 2021, Germany.
[21] – “WG29/WR7 Band Thermoelectric Power Sensor Characterization using Microcalorimetry Technique”, IMS 2022, June 2022, Denver.
[22] – “Scanning Electron Microscopy Applied to Coaxial Air Lines Calibration”, CPEM 2022, December 2022, Wellington.