Tools/Publications
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Standards & Regulatory
[1] LNE and ISC participation to IEC TC 113 “Nanotechnology for electrotechnical products and systems”, ahG 13 “Wafer-scale system integration”, Nov. 2021
[2] ISC participation to IEC TC 113 “Nanotechnology for electrotechnical products and systems”, ahG 13 “Wafer-scale system integration”, Apr. 2022
[3] LNE participation to AFNOR X457 “nanotechnology”, Oct 2022
[4] BAM participation to ISO – TC 107 Metallic and other inorganic coatings, June 2022
[5] BAM participation to DIN – NA 062-01-61 AA: Measuring and test methods for coatings and coating systems, Oct 2022
[6] ISC participation to IEC TC 113 “Nanotechnology for electrotechnical products and systems”, ahG 13 “Wafer-scale system integration”, Dec. 2022
Conferences
[1] “Extend IQ Six-Port Demodulator RF Bandwidth by 250% Using Fourier Based Modelling”, IEEE Conference on Antenna Measurements & Applications (CAMA), 2021, France
[2] “Measuring S-Parameters using millimetre-wave power measurements”, European Microwave Conference, EuMC 2021, Session WS09-EuMC–Workshop, 2021, United Kingdom
[3] “ELENA: un projet européen pour la métrologie électrique à l’échelle nanométrique dans l’industrie”, Forum des microscopies à sonde locale 2022, March 2022, France
[4] « Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy”, Forum des microscopies à sonde locale 2022, March 2022, France
[5] “ELENA – a European project for electrical nanoscale metrology in industry: using ellipsometry for quality control of nanoelectronics”, 9th International Conference on Spectroscopic Ellipsometry ICSE, 9th May 2022, China – online
[6] “Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy”, AT-AP-RASC 2022, May 2022, Spain
[7] “Nanoscale measurements of High Dielectric Constants for piezoelectric materials by Scanning Microwave Microscopy”, E-MRS Spring 2022, May-June 2022, on-line
[8] “Elena – a European project for electrical nanoscale metrology in industry”, 3rd plenary session GDR NAME, October 2022, France
[9] “ELENA: a European project for electrical nanoscale metrology in industry”, CPEM2022, Dec 2022, New Zealand
[10] “Comparison of Matching Networks for Scanning Microwave Microscopy”, CPEM2022, Dec 2022, New Zealand
[11] “Accessing the Loss Tangent of Dielectrics at the Nanoscale: A Novel Approach in Scanning Microwave Microscopy”, CPEM2022, Dec 2022, New Zealand
[12] “Nanoscale capacitance calibration using different AFM probes in scanning microwave microscopy”, CPEM2022, Dec 2022, New Zealand
[13] “Nondestructive imaging of mobile carriers and trapped charges in delta doped p–n junctions buried in silicon”, Gadest 2022, Sep 2022, Austria
[14] “Graphene Standardization – Status update and future”, Graphene 2022-Aachen, July 2022, Germany
[15] “ELENA: a European project for electrical nanoscale metrology in industry” National GDR NAME meeting, October 2022, France
[16] “Microwave Sensing in the Modern Society”, IEEE Radio and Wireless Symposium, 2022, United States
[17] “Nanorobotics and automated platform for microwave characterization of liquids using coaxial evanescent probe”, Nano, Meso, Micro: Science and Innovation for Radio and Photonic, URSI, 2022, France
[18] “Multiscale Microwave and Millimeter-Wave Nondestructive Testing and Evaluation”, IEEE I2MTC – International Instrumentation and Measurement Technology, 2022, Canada
[19] “Calibration Six-Port Basée sur une Analyse de Fourier: Extension Record de 250% des Performances Fréquentielles”, Journées Nationales Microondes, 2022, France
[20] « Plate-forme robotisée et automatisée pour la caractérisation microonde par sonde coaxiale évanescente en milieu liquide », Journées Nationales Microondes, 2022, France
[21] « Instrumentation avancée pour la modélisation et la caractérisation multi-échelles » Colloque LN2 2022, France
[22] “Microwave Microscopy for Advanced and Efficient Materials Analysis”, IEEE MTT-S International Conference on Electromagnetic and Multiphysics Modeling and Optimization (NEMO2022), Special Session WE3, “Electromagnetic and Multiphysics Multiscale Modelling and Characterization for Advanced and Efficient Materials”, 2022, France
[23] “Quantitative Modeling of Scattering-type Scanning Nearfield Optical Microscope (s-SNOM) with the Finite Element Method Utilizing the Software JCMSuite”, DPG Spring Meeting, 2023 , Germany
[24] “ELENA: a European project for electrical nanoscale metrology in industry”, International Congress of Metrology (CIM 2023), March 2023, France
[25] “ELENA: a European project for electrical nanoscale metrology in industry”, C’nano 2023, March 2023, France
[26] « Evaluation de la robustesse de la méthode d’étalonnage Short Open Load appliquée à la mesure de capacité par Scanning Microwave Microscopy », Forum Microscopie sondes locales, Obernai, April 2023, France
[27] “ELENA: a European project for electrical nanoscale metrology in industry”, Forum Microscopie sondes locales, Obernai, April 2023, France
[28] « Cartographie quantitative de la constante diélectrique des nanostructures enterrées en microscopie de force à sonde Kelvin », Forum Microscopie sondes locales, Obernai, April 2023, France